Turbidity Sensors TF16-N
Product Descriptions
Models AF16-N and TF16-N are high precision turbidity sensors for use in various industries. The sensors are designed for inline operation and provide accurate concentration measurements with remarkable repeatability, linearity and resolution.
Modular construction of the sensors offers maximum flexibility in adapting to various process needs. Options include electro-polished sensor bodies, hazardous location (explosion-proof) capability, chemical resistant materials (sapphire windows, titanium, Hastelloy, etc.) and high temperature or high pressure versions.
AF16-N (NIR-Absorption / Turbidity)
A special tungsten lamp produces a constant light beam that passes through the process medium. The attenuation of the light intensity, caused by absorption and/or scattering by dissolved and undissolved substances, is detected by a sealed silicon photodiode.
The AF16-N uses light from 730 – 970 nm (NIR) to measure solids concentration independent from color or color changes. Depending on the optical path length, measuring ranges from high percentage (OPL = 1 mm) to 0 – 100 ppm (OPL = 160 mm) are possible.
TF16-N (Scattered Light / Turbidity)
Light scattered from particles (trace suspended solids, undissolved liquids or gas bubbles) in the medium is detected by eight hermetically sealed silicon photodiodes at an angle of 11°. At the same time, the unscattered light is detected by a reference photodiode (comparable to an AF16-N). This unique dual channel design compensates for disturbances of the carrier medium. The sensor can be calibrated in ppm (DE), EBC or FTU and measures extremely low particle sizes and concentrations. Additionally, high particle concentrations can be monitored independent of color at the direct light detector.
OPL
Special optical windows are made from a single crystal sapphire, providing superior resistance to all abrasive and corrosive media. With the appropriate choice of sensor bodies and windows in various lengths, the optimal OPL (optical path length = distance between the windows) can be achieved to meet the measurement requirements, i.e., low/high measuring ranges at highest resolution.
